Geometrical enhancement of field emission of individual nanotubes studied by in situ transmission electron microscopy

被引：93
|
作者：
Xu, Z
Bai, XD [1 ]
Wang, EG
机构：
[1] Chinese Acad Sci, Beijing Natl Lab Condensed Matter Phys, Beijing 100080, Peoples R China
[2] Chinese Acad Sci, Inst Phys, Beijing 100080, Peoples R China
来源：
APPLIED PHYSICS LETTERS | 2006年 / 88卷 / 13期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1063/1.2188389
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Field emission of an individual multiwalled carbon nanotube, driven by a customer-built piezomanipulator, was measured in a transmission electron microscope. The measurement geometry and the nanotube structure were imaged in situ. A linear dependence of field enhancement factor beta on the distance d between the nanotube tip and its counteranode is found. The enhanced field emission mechanism is studied by a tip-flat emission model. The results indicate that the radius of emission apex r is an important factor in field emission with a relationship of beta proportional to r(-1/2), while the tube length has little influence on beta. (c) 2006 American Institute of Physics.
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页数：3
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