共 50 条
- [43] COMPARISON OF TRANSMISSION ELECTRON MICROSCOPY AND SCANNING ELECTRON MICROSCOPY OF FRACTURE SURFACES JOURNAL OF METALS, 1968, 20 (06): : 26 - &
- [44] CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY OF DEFORMED MICROSTRUCTURES IN MONOLITHIC AND MULTILAYER TiSiN/TiN FILMS INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2010, 24 (1-2): : 18 - 25
- [46] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF SILICON LSI CIRCUITS AND JOSEPHSON JUNCTION DEVICES JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1987, 7 (04): : 319 - 322
- [47] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY FOR IMAGING IC STRUCTURES WITH HIGH-RESOLUTION SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS, 1980, 9 (06): : 363 - 366
- [49] Cross-sectional high-resolution transmission electron microscopy study of the structures of carbon nanotubes Philosophical Magazine A: Physics of Condensed Matter, Defects and Mechanical Properties, 71 (5-2):
- [50] Application of cross-sectional transmission electron microscopy to thin-film-transistor failure analysis IBM J Res Dev, 3 /4 (509-516):