A 12-bit 50-MS/s 3.3-mW SAR ADC with Background Digital Calibration

被引:0
|
作者
Liu, Wenbo [1 ]
Huang, Pingli [2 ]
Chiu, Yun [3 ]
机构
[1] Broadcom Corp, Irvine, CA 92617 USA
[2] Analog Devices Inc, Wilmington, DE USA
[3] Univ Texas Richardson, UT Dallas, Richardson, TX 75080 USA
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暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper describes a background digital calibration technique based on bitwise correlation (BWC) to correct the capacitive digital-to-analog converter (DAC) mismatch error in successive-approximation-register (SAR) analog-to-digital converters (ADC's). Aided by a single-bit pseudorandom noise (PN) injected to the ADC input, the calibration engine extracts all bit weights simultaneously to facilitate a digital-domain correction. The analog overhead associated with this technique is negligible and the conversion speed is fully retained (in contrast to [1] in which the ADC throughput is halved). A prototype 12-bit 50-MS/s SAR ADC fabricated in 90-nm CMOS measured a 66.5-dB peak SNDR and an 86.0-dB peak SFDR with calibration, while occupying 0.046 mm(2) and dissipating 3.3 mW from a 1.2-V supply. The calibration logic is estimated to occupy 0.072 mm(2) with a power consumption of 1.4 mW in the same process.
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