Traceable High Impedance Calibration Standards

被引：0
|
作者：
Haase, Martin [1 ]
Hoffmann, Karel [1 ]
Hudlicka, Martin [2 ]
机构：
[1] Czech Tech Univ, Prague, Czech Republic
[2] Czech Metrol Inst, Prague, Czech Republic
来源：
2016 87TH ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG) | 2016年
关键词：
Calibration standards; characterization; electromagnetic simulation; microwave measurement; scattering parameters;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The paper deals with S-parameters characterization process of newly developed and fabricated high impedance calibration standards, based on APC-7 microwave connectors, suitable for extreme impedances measurement. It evaluates all critical factors playing significant role in the process including dimension and material characterization and used fabrication technology. A combination of the electromagnetic simulator ANSYS HFSS and precise traceable microwave measurements is used for their final characterization and evaluation of the uncertainty. Finally, some technological solutions which could further improve the characterization uncertainty are proposed.
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页数：4
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