Randomness Analysis on LED Block Ciphers

被引：0
|
作者：
Isa, Herman [1 ]
Z'aba, Muhammad Reza [1 ]
机构：
[1] MIMOS Berhad, Cryptog Lab, Kuala Lumpur, Malaysia
来源：
PROCEEDINGS OF THE FIFTH INTERNATIONAL CONFERENCE ON SECURITY OF INFORMATION AND NETWORKS | 2012年
关键词：
LED block cipher; statistical test; partial round test;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper, we present the statistical test of randomness on the Light Encryption Device (LED) Block Cipher. LED is a lightweight block cipher with a 64-bit block size and variable key lengths from 64 to 128 bits (in multiple of 16 bits). The randomness testing was performed using NIST Statistical Test Suite. The tests were performed on reduced rounds of LED with key sizes of 64-, 96- and 128-bits. Our analysis shows that all LED variants tested appear to be random based on the 1% significance level.
引用
收藏
页码：60 / 66
页数：7
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