Overview of photothermal characterization of optical thin film coatings

被引：12
|
作者：
Wu, ZL [1 ]
Thomsen, M [1 ]
Kuo, PK [1 ]
Lu, YS [1 ]
Stolz, C [1 ]
Kozlowski, M [1 ]
机构：
[1] EASTERN MICHIGAN UNIV, DEPT PHYS & ASTRON, YPSILANTI, MI 48197 USA
来源：
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1995: 27TH ANNUAL BOULDER DAMAGE SYMPOSIUM, PROCEEDINGS | 1996年 / 2714卷
关键词：
photothermal technique; nondestructive evaluation; optical thin films; laser damage; weak absorption; thermal conductivity; local defects; overview;
D O I：
10.1117/12.240409
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：465 / 481
页数：17
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