Growth of MgO thin films on M-, A-, C- and R-plane sapphire by laser ablation

被引:43
|
作者
Stampe, PA [1 ]
Bullock, M [1 ]
Tucker, WP [1 ]
Kennedy, RJ [1 ]
机构
[1] Florida A&M Univ, Dept Phys, Tallahassee, FL 32307 USA
关键词
D O I
10.1088/0022-3727/32/15/304
中图分类号
O59 [应用物理学];
学科分类号
摘要
Epitaxial MgO thin films have been grown on single crystal substrates of M-plane (10 (1) over bar 0), A-plane ((1) over bar (1) over bar 20), C-plane (0001) and R-plane (1 (1) over bar 02) sapphire by laser ablation of a Mg metal target in a molecular oxygen atmosphere using 1064 nm radiation from a Nd:YAG laser. X-ray measurements indicate that the MgO grows epitaxially; on all substrates, with its orientation dependent on the cut of the sapphire substrate. (110)-oriented MgO grows on M-plane sapphire, while (111)-oriented MgO films are found on both the A-plane and the C-plane sapphire. The orientation of MgO found on R-plane sapphire appears to be surface and temperature dependent. The principal growth orientation obtained on the R-plane is (100)-oriented MgO although (100) growth tilted 30 degrees from the [1 (1) over bar 1] Al2O3 direction can result. X-ray area mapping has been performed to determine the mosaicity, d value spread and strain present in the films. These data are compared with the in-plane orientation and the mismatch of the MgO and Al2O3 lattices in an attempt to relate the preferred orientation to the plane of the sapphire on which it is grown.
引用
收藏
页码:1778 / 1787
页数:10
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