Thermoelectric conversion in Silicon quantum-dots

被引:3
|
作者
Talbo, V. [1 ]
Saint-Martin, J. [1 ]
Apertet, Y. [1 ]
Retailleau, S. [1 ]
Dollfus, P. [1 ]
机构
[1] Univ Paris 11, CNRS UMR 8622, Inst Fundamental Elect, F-91405 Orsay, France
关键词
D O I
10.1088/1742-6596/395/1/012112
中图分类号
O414.1 [热力学];
学科分类号
摘要
Quantum dot-based devices have specific thermoelectric properties. Thanks to their delta-like density of states, they are expected to exhibit high Seebeck coefficient, nearly zero electronic thermal conductance and ultra-low phononic thermal conductance if embedded in an oxide matrix Using a physical simulator dedicated to the sequential transport through quantum dots (QDs), the thermoelectric properties of devices based on Silicon QDs embedded in silicon oxide are assessed. Fully self-consistent 3D Poisson/Schrodinger simulation is performed. From the accurate computation of tunneling rates, a Monte-Carlo algorithm is used to solve the master equation and to extract the current-voltage characteristics for different temperature gradients applied between the electrodes. Theevolution of both the Seebeck coefficient and the electronic conductivity resulting from a temperature bias are investigated for dissymmetric spherical and cubic quantum-dot-based (QD) single-electron transistors (SETs). Finally, the validity of the linear regime and the potentiality of semiconducting SETs in the field of Seebeck nanoscale metrology are discussed.
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页数:8
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