Applying CEM Techniques to Solve Nano-Scale Quantum Transport Problems

被引:0
|
作者
Huang, Jun Z. [1 ]
Chew, Weng Cho [2 ]
Jiang, Li Jun [3 ]
机构
[1] Purdue Univ, Sch ECE, W Lafayette, IN 47907 USA
[2] Univ Illinois, Dept ECE, Champaign, IL 61801 USA
[3] Univ Hong Kong, Dept EEE, Hong Kong, Hong Kong, Peoples R China
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Two widely used algorithms in computational electromagnetics (CEM) society, namely the asymptotic waveform evaluation (AWE) technique and the model order reduction (MOR) mode matching method, are employed to calculate electron wave propagation in novel nanoelectronic devices.
引用
收藏
页码:1391 / 1392
页数:2
相关论文
共 50 条
  • [1] Quantum transport modeling in nano-scale devices
    Ogawa, M
    Tsuchiya, H
    Miyoshi, T
    [J]. SISPAD 2002: INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES, 2002, : 261 - 266
  • [2] Quantum electron transport modeling in nano-scale devices
    Ogawa, M
    Tsuchiya, H
    Miyoshi, T
    [J]. IEICE TRANSACTIONS ON ELECTRONICS, 2003, E86C (03) : 363 - 371
  • [3] Plasmon controlled quantum transport in nano-scale junctions
    Selzer, Yoram
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2019, 258
  • [4] QUANTUM TRANSPORT IN BALLISTIC NANO-SCALE CORBINO DISKS
    KIRCZENOW, G
    [J]. JOURNAL OF PHYSICS-CONDENSED MATTER, 1994, 6 (39) : L583 - L588
  • [5] Scattering in a nano-scale MOSFET: A quantum transport analysis
    Chen, WQ
    Register, LF
    Banerjee, SK
    [J]. 2003 THIRD IEEE CONFERENCE ON NANOTECHNOLOGY, VOLS ONE AND TWO, PROCEEDINGS, 2003, : 32 - 35
  • [6] Nonequilibrium GW approach to quantum transport in nano-scale contacts
    Thygesen, Kristian S.
    Rubio, Angel
    [J]. JOURNAL OF CHEMICAL PHYSICS, 2007, 126 (09):
  • [7] Quantum interference effect of resonant transport in nano-scale systems
    Sasada, K
    Hatano, N
    [J]. PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2005, 29 (3-4): : 609 - 613
  • [8] Techniques for nano-scale deformation measurement
    Fei, S
    Sun, YF
    Shi, XQ
    Stephen, WCK
    [J]. 6TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, PROCEEDINGS (EPTC 2004), 2004, : 729 - 734
  • [9] Electrical transport in nano-scale silicon devices
    Kawaura, H
    Sakamoto, T
    [J]. IEICE TRANSACTIONS ON ELECTRONICS, 2001, E84C (08) : 1037 - 1042
  • [10] Transport properties of multilayers with nano-scale structures
    Department of Physics, Tokyo Metropol. Univ., H., Tokyo, Japan
    不详
    不详
    [J]. J Magn Magn Mater, (213-215):