An Ultrahigh-Speed resonant-tunneling analog-to-digital converter

被引:0
|
作者
Hattori, K [1 ]
Takamatsu, Y [1 ]
Waho, T [1 ]
机构
[1] Sophia Univ, Fac Sci & Technol, Dept Elect & Elect Engn, Tokyo 1028554, Japan
来源
IEICE TRANSACTIONS ON ELECTRONICS | 2002年 / E85C卷 / 03期
关键词
resonant-tunneling; quantizer; analog-to-digital converter; compound semiconductor;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A flash analog-to-digital converter (ADC) that uses resonant-tunneling complex gates is proposed. The ternary quantizers, consisting of monostable-to-multistable transition logic (MML) circuits, convert the analog input signal into the ternary thermometer code. This code is then converted into the binary Gray-code output by a multiple-valued multiple-input monostable-bistable transition logic element (M-2-MOBILE). By assuming InP-based resonant-tunneling diode (RTD) and heterojunction field-effect transistor technology, we have carried out SPICE simulation that demonstrates a 4-bit, 10-GS/s ADC operation. The input bandwidth, defined as a frequency at which the effective number of bit decreases by 0.5 LSB, was also estimated to be 500 MHz. Compact circuit configuration, which is due to the combination of MML and M-2-MOBILE, reduces the device count and power dissipation by a factor of two compared with previous RTD-based ADCs.
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页码:586 / 591
页数:6
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