A Study for Big-Data (Hadoop) Application in Semiconductor Manufacturing

被引:0
|
作者
Kang, Sheng [1 ]
Chien, Wei-Ting Kary [1 ]
Yang, Jun Gang [2 ]
机构
[1] Semicond Mfg Int Shanghai Corp, Dept Qual Engn, Shanghai, Peoples R China
[2] Shanghai Jiao Tong Univ, Sch Mech Engn, Shanghai, Peoples R China
关键词
FDC; SPC; Hadoop; APC; Big data; PCA;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The semiconductor industry as one of the world's most automated and advanced manufacturing produces a huge variety of data every day. How to maximize the usage of these data is what we want to discuss in this paper. A big-data platform and its applications for semiconductor manufacturing based on Hadoop framework are proposed. Hadoop is a distributed data storage and computing solution with related low hardware cost and high system reliability. It is a great significance to conducting Hadoop platform into semiconductor manufacturing that improve effectiveness and reduce production cost. To realize the aim, we illustrate two applications of statistics methods, such as PCA (Principal Component Analysis) and SVM (Support Vector Machine). PCA can be used to optimize KPI (Key Performance Indicator) enactment through the correlation between the parameters. These KPI can provide effective monitor of process anomalies. SVM is a machine learning method is useful to build a semiconductor IKL (Intelligent Knowledge Library) to store and apply engineering lesson learns based on super large amount of data. Engineers can fulfil quick safety checking based on the mode setting by SVM.
引用
收藏
页码:1893 / 1897
页数:5
相关论文
共 50 条
  • [41] Voter Privacy and Big-Data Elections
    Judge, Elizabeth F.
    Pal, Michael
    OSGOODE HALL LAW JOURNAL, 2021, 58 (01): : 1 - 55
  • [42] An evidential analytics for buried information in big data samples: Case study of semiconductor manufacturing
    Ko, Yu-Chien
    Fujita, Hamido
    INFORMATION SCIENCES, 2019, 486 : 190 - 203
  • [44] A Minimax Approach for Classification with Big-data
    Krishnan, R.
    Jagannathan, S.
    Samaranayake, V. A.
    2018 IEEE INTERNATIONAL CONFERENCE ON BIG DATA (BIG DATA), 2018, : 1437 - 1444
  • [45] BIG-DATA VISUALIZATION FOR TRANSLATIONAL NEUROTRAUMA
    Nielson, Jessica
    Inoue, Tomoo
    Paquette, Jesse
    Lin, Amity
    Sacramento, Jeffrey
    Liu, Aiwen W.
    Guandique, Cristian F.
    Irvine, Karen-Amanda
    Gensel, John C.
    Beattie, Michael S.
    Bresnahan, Jacqueline C.
    Manley, Geoffrey T.
    Carlsson, Gunnar
    Lum, Pek Yee
    Ferguson, Adam R.
    JOURNAL OF NEUROTRAUMA, 2013, 30 (15) : A61 - A62
  • [46] Persisting big-data: The NoSQL landscape
    Corbellini, Alejandro
    Mateos, Cristian
    Zunino, Alejandro
    Godoy, Daniela
    Schiaffino, Silvia
    INFORMATION SYSTEMS, 2017, 63 : 1 - 23
  • [47] Big-Data Clustering with Genetic Algorithm
    Mortezanezhad, Afsaneh
    Daneshifar, Ebrahim
    2019 IEEE 5TH CONFERENCE ON KNOWLEDGE BASED ENGINEERING AND INNOVATION (KBEI 2019), 2019, : 702 - 706
  • [48] Big-Data Science: Infrastructure Impact
    Monga, Inder
    Prabhat
    PROCEEDINGS OF THE INDIAN NATIONAL SCIENCE ACADEMY, 2018, 84 (02): : 359 - 370
  • [49] A happy oyster is a big-data oyster
    Rutkin, Aviva
    NEW SCIENTIST, 2014, 221 (2958) : 23 - 23
  • [50] Big-Data Security Management Issues
    Paryasto, Marisa
    Alamsyah, Andry
    Rahardjo, Budi
    Kuspriyanto
    2014 2ND INTERNATIONAL CONFERENCE ON INFORMATION AND COMMUNICATION TECHNOLOGY (ICOICT), 2014,