Study of various strain energy distribution in InGaN/GaN multiple quantum wells

被引:1
|
作者
Lin, YS [1 ]
机构
[1] Chinese Naval Acad, Dept Elect Engn, Kaohsiung 813, Taiwan
关键词
D O I
10.1007/s10853-005-5629-x
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The formation of In-rich quantum dot structures will induce strain energy in the quantum well layer, forming the clusters and stacking faults influencing the optical properties. Our results showed different QW widths with the formation of various In-rich quantum dot structures and different levels of strain energy. Upon thermal annealing, energy relaxation resulted in the reshaping of quantum dots and hence the changes of optical properties. The results of temperature variations of PL spectral peak, integrated PL intensity and PL decay time showed consistent trends in varying strain energy distribution. (c) 2006 Springer Science + Business Media, Inc.
引用
收藏
页码:2953 / 2958
页数:6
相关论文
共 50 条
  • [1] Study of various strain energy distribution in InGaN/GaN multiple quantum wells
    Yen-Sheng Lin
    [J]. Journal of Materials Science, 2006, 41 : 2953 - 2958
  • [2] Strain-balanced InGaN/GaN multiple quantum wells
    Van den Broeck, D. M.
    Bharrat, D.
    Hosalli, A. M.
    El-Masry, N. A.
    Bedair, S. M.
    [J]. APPLIED PHYSICS LETTERS, 2014, 105 (03)
  • [3] Atomic-scale strain field and In atom distribution in multiple quantum wells InGaN/GaN
    Watanabe, K
    Nakanishi, N
    Yamazaki, T
    Yang, JR
    Huang, SY
    Inoke, K
    Hsu, JT
    Tu, RC
    Shiojiri, M
    [J]. APPLIED PHYSICS LETTERS, 2003, 82 (05) : 715 - 717
  • [4] Structural characterization and elastic strain of InGaN/GaN multiple quantum wells
    Wu, MF
    Zhou, SQ
    Yao, SD
    Yang, ZJ
    Tong, YZ
    Yu, TJ
    Zhang, GY
    [J]. PROCEEDINGS OF THE SIXTH CHINESE OPTOELECTRONICS SYMPOSIUM, 2003, : 40 - 45
  • [5] Enhanced luminescence of InGaN/GaN multiple quantum wells by strain reduction
    Niu Nanhui
    Wang Huaibing
    Liu Jianping
    Liu Naixin
    Xing Yanhui
    Han Jun
    Deng Jun
    Shen Guangdi
    [J]. SOLID-STATE ELECTRONICS, 2007, 51 (06) : 860 - 864
  • [6] Energy selected elemental analysis of InGaN multiple quantum wells in GaN
    Fay, MW
    Norris, DJ
    Hetherington, CJD
    Cullis, AG
    Parbrook, PJ
    Whitehouse, CR
    Schurman, M
    [J]. MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS, 1999, (164): : 411 - 414
  • [7] Investigation of electron energy states in InGaN/GaN multiple quantum wells
    Asghar, M.
    Hurwitz, E.
    Melton, A.
    Jamil, M.
    Ferguson, Ian T.
    Tsu, Rahpael
    [J]. PHYSICA B-CONDENSED MATTER, 2012, 407 (15) : 2850 - 2853
  • [8] Improved quality of InGaN/GaN multiple quantum wells by a strain releif layer
    Niu, NH
    Wang, HB
    Liu, JP
    Liu, NX
    Xing, YH
    Han, J
    Deng, J
    Shen, GD
    [J]. JOURNAL OF CRYSTAL GROWTH, 2006, 286 (02) : 209 - 212
  • [9] High precision determination of the elastic strain of InGaN/GaN multiple quantum wells
    Wu, MF
    Zhou, SQ
    Yao, SD
    Zhao, Q
    Vantomme, A
    Van Daele, B
    Piscopiello, E
    Van Tendeloo, G
    Tong, YZ
    Yang, ZJ
    Yu, TJ
    Zhang, GY
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2004, 22 (03): : 920 - 924
  • [10] Electron Microscope Study of Strain in InGaN Quantum Wells in GaN Nanowires
    Geiss, R. H.
    Bertness, K. A.
    Roshko, A.
    Read, D. T.
    [J]. ELECTRON CRYSTALLOGRAPHY FOR MATERIALS RESEARCH AND QUANTITATIVE CHARACTERIZATION OF NANOSTRUCTURED MATERIALS, 2009, 1184 : 125 - 130