Fabrication and Characterization of (Ba,La)SnO3 Semiconducting Epitaxial Films on (111) and (001) SrTiO3 Substrates

被引:2
|
作者
Miura, Kohei [1 ]
Kiriya, Daisuke [1 ]
Yoshimura, Takeshi [1 ]
Ashida, Atsushi [1 ]
Fujimura, Norifumi [1 ]
机构
[1] Osaka Prefecture Univ, Naka Ku, 1-1 Gakuen Cho, Sakai, Osaka 5998531, Japan
关键词
BaSnO3; Hall effect; orientation dependence; transparent oxides; OPTICAL-PROPERTIES; BASNO3; FILMS; THIN-FILMS; TRANSPARENT; PEROVSKITE; OXIDE; CONDUCTIVITY; PRINCIPLE;
D O I
10.1002/pssa.201700800
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Recently, BaSnO3 has attracted great attention as a promising transparent oxide semiconductor with a large bandgap (3.3 eV) and high mobility (320 cm(2) V-1 s(-1)), and many reports have discussed the origin of its high mobility. Specifically, its effective mass m* has been investigated with both calculations and experiments. First-principles calculations have suggested that m* is small near the Gamma point and that this m* assists the high mobility. Therefore, it is quite important to study the anisotropy in the mobility of this material. However, except for (001) BaSnO3, there are almost no reports on the electrical transport properties of the films with other orientations. In this paper, the authors fabricate (111) and (001) (Ba,La)SnO3 films by using pulsed laser deposition to evaluate the structural differences including the epitaxial strain and the orientation distribution generated from the differences in the growth mode that is originated in the ionic arrangement of each surface. The effects of the structural differences for the conductivities of (001) and (111) films and how do the authors achieve the epitaxial films with high mobility are discussed.
引用
收藏
页数:7
相关论文
共 50 条
  • [21] Structural and electrical properties of (110) ZnO epitaxial thin films on (001) SrTiO3 substrates
    Wu, Yunlong
    Zhang, Liuwan
    Xie, Guanlin
    Ni, Jun
    Chen, Yonghai
    SOLID STATE COMMUNICATIONS, 2008, 148 (5-6) : 247 - 250
  • [22] Structural properties of epitaxial SrCuO2 thin films on SrTiO3 (001) substrates
    Mi, Shao-Bo
    THIN SOLID FILMS, 2011, 519 (07) : 2071 - 2074
  • [23] Microstructure and electrical conductivity of epitaxial BaRuO3 thin films prepared on (001), (110) and (111) SrTiO3 substrates by laser ablation
    Ito, Akihiko
    Masumoto, Hiroshi
    Goto, Takashi
    MATERIALS TRANSACTIONS, 2007, 48 (07) : 1919 - 1923
  • [24] Microstructure and electrical conductivity of epitaxial SrRuO3 thin films prepared on (001), (110) and (111) SrTiO3 substrates by laser ablation
    Ito, Akihiko
    Masumoto, Hiroshi
    Goto, Takashi
    MATERIALS TRANSACTIONS, 2007, 48 (02) : 227 - 233
  • [25] Microstructure and electrical conductivity of epitaxial CaRuO3 thin films prepared on (001), (110) and (111) SrTiO3 substrates by laser ablation
    Ito, Akihiko
    Masumoto, Hiroshi
    Goto, Takashi
    JOURNAL OF THE CERAMIC SOCIETY OF JAPAN, 2007, 115 (1347) : 683 - 687
  • [26] The role of etching anisotropy in the fabrication of freestanding oxide microstructures on SrTiO3(100), SrTiO3(110), and SrTiO3(111) substrates
    Plaza, Alejandro Enrique
    Manca, Nicola
    Bernini, Cristina
    Marre, Daniele
    Pellegrino, Luca
    APPLIED PHYSICS LETTERS, 2021, 119 (03)
  • [27] Initial growth stages of epitaxial BaTiO3 films on vicinal SrTiO3:Nb (001) substrates
    Visinoiu, A
    Alexe, M
    Lee, HN
    Zakharov, DN
    Pignolet, A
    Hesse, D
    Gösele, U
    FERROELECTRIC THIN FILMS X, 2002, 688 : 285 - 290
  • [28] Initial stage nucleation and growth of epitaxial SrRuO3 thin films on (001) SrTiO3 substrates
    Chae, RH
    Rao, RA
    Gan, Q
    Eom, CB
    JOURNAL OF ELECTROCERAMICS, 2000, 4 (2-3) : 345 - 349
  • [29] Microstructure and strain relaxation of epitaxial PrScO3 thin films grown on (001) SrTiO3 substrates
    Chen, Y. B.
    Katz, M. B.
    Pan, X. Q.
    Folkman, C. M.
    Das, R. R.
    Eom, C. B.
    APPLIED PHYSICS LETTERS, 2007, 91 (03)
  • [30] Microstructure of epitaxial SrRuO3 thin films on (001) SrTiO3
    Jiang, JC
    Pan, XQ
    Chen, CL
    APPLIED PHYSICS LETTERS, 1998, 72 (08) : 909 - 911