Enhanced structural, electrical and optical properties of evaporated CdZnTe thin films deposited on different substrates

被引：26
|
作者：
Chander, Subhash [1 ,2 ]
Dhaka, M. S. [1 ,2 ]
机构：
[1] Mohanlal Sukhadia Univ, Dept Phys, Udaipur 313001, India
[2] Iowa State Univ Sci & Technol, Microelect Res Ctr, Ames, IA 50011 USA
来源：
MATERIALS LETTERS | 2017年 / 186卷
关键词：
Thin films; Physical vapor deposition; Physical properties; Substrates; Optical materials and properties; GROWTH; TEMPERATURE; SUBLIMATION; MORPHOLOGY; DETECTORS;
D O I：
10.1016/j.matlet.2016.09.093
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
CdZnTe thin films of thickness 300 nm were deposited on glass, ITO, FTO and silicon wafer at room temperature employing electron beam vacuum evaporation. These deposited films were analyzed using XRD, source meter and UV-Vis spectrophotometer to investigate structural, electrical and optical properties, respectively. The films are found to be polycrystalline in nature with zinc-blende cubic structure and evaluated structural parameters show significant effect of used substrates. The electrical study shows that the conductivity is maximum for films deposited on FTO substrate. The optical analysis shows wide transmittance with the energy band gap in the range 1.71-2.28 eV.
引用
收藏
页码：45 / 48
页数：4
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