Perpendicular magnetic anisotropy in CoGd/Pd multilayered films

被引：0
|
作者：
Yang, T
Suzuki, A
Matsumoto, T
Yamamoto, R
机构：
[1] Institute of Industrial Science, University of Tokyo, 7-22-1 Roppongi, Minato-Ku
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1997年 / 161卷 / 01期
关键词：
D O I：
10.1002/1521-396X(199705)161:1<257::AID-PSSA257>3.0.CO;2-N
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The magnetic properties of sputtered RE-TM(CoGd)/Pd multilayered films were studied. CoGd layers with high Gd concentration were amorphous. Reducing the Gd concentration, CoGd layers changed from amorphous to crystalline gradually. Like in the crystalline Co/Pd multilayered films, perpendicular magnetic anisotropy (PMA) was observed only for CoGd/Pd multilayered films with thin magnetic layer. It is interesting to note that the critical magnetic layer thickness, below which the easy magnetization axis is perpendicular to the film plane, reaches 2.5 nm for CoGd/Pd multilayered films with amorphous CoGd layers and is larger than that of Co/Pd multilayered films. The PMA energy density of CoGd layers was much higher than that of amorphous CoGd films. These results are discussed in terms of the perpendicular magnetization mechanism in amorphous CoGd films as well as of interface magnetic anisotropy.
引用
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页码：257 / 264
页数：8
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