A comparison between three-dimensional and two-dimensional grain boundary plane analysis

被引:49
|
作者
Randle, V [1 ]
Davies, H [1 ]
机构
[1] Univ Coll Swansea, Dept Mat Engn, Swansea SA2 8PP, W Glam, Wales
关键词
grain boundary plane; electron backscatter diffraction; Sigma; 3; CSLs; annealing twins;
D O I
10.1016/S0304-3991(01)00137-1
中图分类号
TH742 [显微镜];
学科分类号
摘要
An EBSD-based methodology for assessment of grain boundary planes, in particular Sigma3 boundaries in face-centred cubic materials, has recently been devised. The method is based on trace analysis in a single, two-dimensional section rather than the more arduous three-dimensional method. The paper reports a data set of grain boundary planes in alpha-brass, mainly Sigma3s, which have been analysed using both methods so that they can be compared and a recommendation made about the usefulness of the new method. It is shown that the new, two-dimensional method is a valuable tool in the analysis of grain boundary geometry, especially when used in conjunction with nu/nu(m) a parameter for assessing the proximity to the misorientation reference structure. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:153 / 162
页数:10
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