An Innovative Waveguide Interface and Quarter-Wavelength Shim for the 220-325 GHz Band

被引：0

作者：

Lau, Yuenie S. ^{[1
]}

Vondran, David J. ^{[1
]}

机构：

[1] OML Inc, Morgan Hill, CA USA

来源：

80TH ARFTG MICROWAVE MEASUREMENT CONFERENCE: ADVANCES IN WIRELESS COMMUNICATIONS TEST AND MEASUREMENTS | 2012年

关键词：

Millimeter; S-parameters; waveguide flange; vector network analyzer; MIL-DTL-3922/67D; shim; TRL; LRL;

D O I：

暂无

中图分类号：

TN [电子技术、通信技术];

学科分类号：

0809 ;

摘要：

An innovative waveguide flange offers superior alignment based on a concentric mating mechanism consisting of a boss and jack interface. Above 100 GHz, this flange interface improves repeatability and precision of S-parameters measurements by eliminating the mechanical tolerance build-up associated with separate alignment pins. By simplifying the build-up of tolerance to only the boss and jack interface, the alignment improves match, precision, repeatability and residual calibration performance for mm-wave and sub-mm-wave S-parameter measurements. This flange is entirely compatible with the MIL-DTL-3922/67D standard. This paper presents connection repeatability for 220-325 GHz (WR-03 band). This flange is awaiting standardization in the P1785 working group of IEEE.

引用

页数：4

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