An Innovative Waveguide Interface and Quarter-Wavelength Shim for the 220-325 GHz Band

被引：0
|
作者：
Lau, Yuenie S. [1 ]
Vondran, David J. [1 ]
机构：
[1] OML Inc, Morgan Hill, CA USA
来源：
80TH ARFTG MICROWAVE MEASUREMENT CONFERENCE: ADVANCES IN WIRELESS COMMUNICATIONS TEST AND MEASUREMENTS | 2012年
关键词：
Millimeter; S-parameters; waveguide flange; vector network analyzer; MIL-DTL-3922/67D; shim; TRL; LRL;
D O I：
暂无
中图分类号：
TN [电子技术、通信技术];
学科分类号：
0809 ;
摘要：
An innovative waveguide flange offers superior alignment based on a concentric mating mechanism consisting of a boss and jack interface. Above 100 GHz, this flange interface improves repeatability and precision of S-parameters measurements by eliminating the mechanical tolerance build-up associated with separate alignment pins. By simplifying the build-up of tolerance to only the boss and jack interface, the alignment improves match, precision, repeatability and residual calibration performance for mm-wave and sub-mm-wave S-parameter measurements. This flange is entirely compatible with the MIL-DTL-3922/67D standard. This paper presents connection repeatability for 220-325 GHz (WR-03 band). This flange is awaiting standardization in the P1785 working group of IEEE.
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页数：4
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