Effect of p-GaN layer doping on the photoresponse of GaN-based p-i-n ultraviolet photodetectors

被引:1
|
作者
Wang, Jun [1 ]
Guo, Jin [1 ]
Xie, Feng [1 ]
Wang, Wanjun [1 ]
Wang, Guosheng [1 ]
Wu, Haoran [1 ]
Wang, Tanglin [1 ]
Song, Man [1 ]
机构
[1] China Elect Technology Grp Corp, Res Inst 38, Hefei 230088, Peoples R China
关键词
Numerical simulation; photoresponse; GaN; ultraviolet; photodetector; doping; schottky; device design; TEMPERATURE; DETECTORS; ELECTRON; SILICON;
D O I
10.1117/12.2191941
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report on two-dimensional (2D) numerical simulations of photoresponse characteristics for GaN based p-i-n ultraviolet (UV) photodetectors. Effects of doping density of p-GaN layer on the photoresponse have been investigated. In order to accurately simulate the device performance, the theoretical calculation includes doping-dependent mobility degradation by Arora model and high field saturation model. Theoretical modeling shows that the doping density of p-GaN layer can significantly affect the photoresponse of GaN based p-i-n UV photodetectors, especially at schottky contact. We have to make a suitable choice of the doping in the device design according to the simulation results.
引用
收藏
页数:6
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