The method of risk assessment for technological innovation and the pattern of risk investigation based on patent analysis

被引：0
|
作者：
Liu, Song [1 ]
Liu, Yu-qin
Wang, Xue-feng [1 ]
机构：
[1] Beijing Inst Technol, Sch Management & Econ, Beijing 100081, Peoples R China
来源：
PROCEEDINGS OF 2008 INTERNATIONAL CONFERENCE ON RISK AND RELIABILITY MANAGEMENT, VOLS I AND II | 2008年
关键词：
risk assessment; technological innovation; patent analysis; investigation pattern;
D O I：
暂无
中图分类号：
F [经济];
学科分类号：
02 ;
摘要：
In this paper, we present the multi-level fuzzy comprehensive assessment method of technological innovation based on technological innovation process and risk category. We also investigate various kinds of technological risk and competitive risk factors in technological innovation through patent analysis, and then we build the investigation pattern and its standard of technological and competitive risk based on patent analysis. At last we take the 863 project related to ASON as an actual example to make assessment of technological risk and competitive risk using our assessment method and investigation pattern.
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页码：420 / 425
页数：6
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