Investigation on the surface flashover of high gain SI-GaAs PCSS

被引:0
|
作者
Ji, Weili [1 ]
Shi, Wei [1 ]
Ma, Cheng [1 ]
Cao, Juncheng [1 ,2 ]
机构
[1] Xian Univ Technol, Res Ctr Ultrafast Photoelect Technol, Xian 710048, Shaanxi, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Key Lab Terahertz Solid State Technol, Shanghai 200050, Peoples R China
基金
中国国家自然科学基金;
关键词
desorption; discharge; high gain PCSS; SI-GaAs; surface flashover; GENERATION; SWITCHES; PULSE;
D O I
10.1002/mop.31175
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The GaAs photoconductive semiconductor switch (PCSS) is generally recognized currently as a leading power electronic device for its unique advantages. A major limitation of PCSS has been its surprisingly low voltage threshold for the surface flashover found when PCSS works at the high gain mode. In this paper, the surface flashover of high gain PCSS is studied by experiments. We propose that the non-uniform distribution of the surface field that resulted from the photo-activated charge domain (PACD) and the gas desorption is the key cause of such reducing of the SF field. SF6 ambient dielectric is efficient in increasing the surface field, and the experiment results show that the PCSS we developed could resist a voltage as high as 20 kV/cm when the ambient dielectric is 3 atmospheric SF6. This conclusion has the practical application of significance to improve the performance of the high gain PCSS, which is severely limited by the premature breakdown effects.
引用
收藏
页码:1439 / 1445
页数:7
相关论文
共 50 条
  • [21] Structural properties of SI-GaAs grown in space
    Chen, NF
    Wang, YT
    Zhong, XR
    Lin, LY
    GRAVITATIONAL EFFECTS IN MATERIALS AND FLUID SCIENCES, 1999, 24 (10): : 1211 - 1214
  • [22] Investigation of ultra-wideband electromagnetic radiation based on SI-GaAs photoconductive switches
    Shi Wei
    Ji Weili
    Jia Wanli
    MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2012, 54 (04) : 900 - 904
  • [23] Investigation of deep-level defects in 10 MeV electrons irradiated Si-GaAs
    Wu, FM
    Zhao, ZY
    Li, HF
    COMPOUND SEMICONDUCTOR ELECTRONICS AND PHOTONICS, 1996, 421 : 263 - 268
  • [24] Study on the performance of SI-GaAs and SI-InP surface barrier detectors for alpha and gamma detection
    Jayavel, P
    Ghosh, S
    Jhingan, A
    Avasthi, DK
    Asokan, K
    Kumar, J
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2000, 454 (01): : 252 - 256
  • [25] Metastable defects in SI-GaAs: Effect of high energy ion-irradiation
    Kabiraj, D
    Ghosh, S
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2003, 212 : 135 - 139
  • [26] SURFACE CHARACTERIZATION OF LEC SI-GAAS USING PHOTOREFLECTANCE WITH SUB-BANDGAP EXCITATION
    BHIMNATHWALA, H
    BORREGO, JM
    SOLID-STATE ELECTRONICS, 1992, 35 (10) : 1503 - 1511
  • [27] Characteristics of p-GaAs/p-AlxGa1-xAs/si-GaAs studied by surface photovoltage
    Fan, C.
    Chen, X. L.
    Jiao, G. Ch.
    Hu, C. L.
    Qian, Y. Sh.
    NANOPHOTONICS AND MICRO/NANO OPTICS, 2012, 8564
  • [28] Back-gating effect of GaAs MESFET on undoped SI-GaAs
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 2000, 21 (01): : 64 - 68
  • [29] Hybrid axial and radial Si-GaAs heterostructures in nanowires
    Conesa-Boj, Sonia
    Dunand, Sylvain
    Russo-Averchi, Eleonora
    Heiss, Martin
    Ruffer, Daniel
    Wyrsch, Nicolas
    Ballif, Christophe
    Fontcuberta i Morral, Anna
    NANOSCALE, 2013, 5 (20) : 9633 - 9639
  • [30] Electron paramagnetic resonance experiments applied to Si-GaAs
    Hendorfer, G
    PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1997, 35 (01): : 99 - 114