Validation and testing of design hardening for single event effects using the 8051 microcontroller

被引：0

作者：

Howard, JW ^{[1
]}

LaBel, KA ^{[1
]}

Carts, MA ^{[1
]}

Seidleck, C ^{[1
]}

Gambles, JW ^{[1
]}

Ruggles, SL ^{[1
]}

机构：

[1] NASA, Goddard Space Flight Ctr, Jackson & Tull Chartered Engineers, Greenbelt, MD 20771 USA

来源：

NSREC: 2005 IEEE Radiation Effects Data Workshop, Workshop Record | 2005年

关键词：

Single Event Effects; Hardened-By-Design; microcontroller; radiation effects;

D O I：

暂无

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

With the dearth of dedicated radiation hardened foundries, new and novel techniques are being developed for hardening designs using non-dedicated foundry services. In this paper, we will discuss the implications of validating these methods for the single event effects (SEE) in the space environment. Topics include the types of tests that are required and the design coverage (i.e., design libraries: do they need validating for each application?). Finally, an 8051 microcontroller core from NASA Institute of Advanced Microelectronics (IA mu E) CMOS Ultra Low Power Radiation Tolerant (CULPRiT) design is evaluated for SEE mitigative techniques against two commercial 8051 devices.

引用

页码：85 / 92

页数：8

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