Microstructure - Property Relationships in Nanocrystalline Oxide Thin Films

被引：54
|
作者：
Kosacki, I. [1 ]
Anderson, H. U. [1 ]
机构：
[1] Univ Missouri, Elect Mat Appl Res Ctr, Rolla, MO 65401 USA
来源：
IONICS | 2000年 / 6卷 / 3-4期
关键词：
D O I：
10.1007/BF02374080
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Results of studies of the preparation, structure and physical properties of nanocrystalline CeO2, ZrO2:16% Y (YSZ) and SrCeO3:5% Yb oxide thin films are presented. A polymeric precursor spin coating technique has been used to obtain dense specimens with stable and uniform microstructure controlled in the grain size range of 1-400 rim. A variety of characterization techniques including X-ray diffraction, impedance spectroscopy, Raman scattering and optical absorption have been used for the evaluation of the microstructure-property relationships. Nanocrystalline specimens are characterized by enhanced electrical conductivity and different stoichiometry compared with microcrystalline materials. A direct comparison has been achieved between the conductivity and quantum confinement effects observed in optical measurements and correlated with a defect model.
引用
收藏
页码：294 / 311
页数：18
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