Error of image saturation in the structured-light method

被引:23
|
作者
Qi, Zhaoshuai [1 ]
Wang, Zhao [1 ]
Huang, Junhui [1 ]
Xing, Chao [1 ]
Gao, Jianmin [1 ]
机构
[1] Xi An Jiao Tong Univ, Inst Mfg Syst & Qual Engn, 28 Xianning West Rd, Xian 710049, Shaanxi, Peoples R China
基金
中国国家自然科学基金;
关键词
3-DIMENSIONAL SHAPE MEASUREMENT; PHASE-MEASURING PROFILOMETRY; FRINGE PROJECTION TECHNIQUE; INSPECTION; ALGORITHM;
D O I
10.1364/AO.57.00A181
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In the phase-measuring structured-light method, image saturation will induce large phase errors. Usually, by selecting proper system parameters (such as the phase-shift number, exposure time, projection intensity, etc.), the phase error can be reduced. However, due to lack of a complete theory of phase error, there is no rational principle or basis for the selection of the optimal system parameters. For this reason, the phase error due to image saturation is analyzed completely, and the effects of the two main factors, including the phase-shift number and saturation degree, on the phase error are studied in depth. In addition, the selection of optimal system parameters is discussed, including the proper range and the selection principle of the system parameters. The error analysis and the conclusion are verified by simulation and experiment results, and the conclusion can be used for optimal parameter selection in practice. (C) 2017 Optical Society of America
引用
收藏
页码:A181 / A188
页数:8
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