Temperature calibration of CMOS magnetic vector probe for contactless angle measurement system

This paper reports on the offset behavior of an integrated CMOS magnetotransistor vector probe. For the first time, measurement results on the temperature dependence of the offset and on its time stability are presented. They encourage the realization of a temperature calibrated angle measurement system [1]. This system consists of a two dimensional magnetic sensor integrated with circuitry on a single chip in combination with a small permanent magnet (Fig. 1). It exhibits 1 degrees resolution and 3 degrees accuracy.