Dynamic Specification Testing and Diagnosis of High-Precision Sigma-Delta ADCs

被引：6
|
作者：
Kook, Sehun [1 ,2 ]
Banerjee, Aritra [1 ]
Chatterjee, Abhijit [2 ]
机构：
[1] Georgia Tech, Atlanta, GA 30332 USA
[2] Georgia Tech, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
来源：
IEEE DESIGN & TEST | 2013年 / 30卷 / 04期
关键词：
D O I：
10.1109/MDT.2012.2217111
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
[No abstract available]
引用
收藏
页码：36 / 48
页数：13
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