Curve Fitting for Error Rate Data

被引：0
|
作者：
Sergienko, Alexander B. [1 ]
机构：
[1] St Petersburg Electrotech Univ LETT, Dept Theoret Fundamentals Radio Engn, St Petersburg, Russia
来源：
2019 XVI INTERNATIONAL SYMPOSIUM PROBLEMS OF REDUNDANCY IN INFORMATION AND CONTROL SYSTEMS (REDUNDANCY) | 2019年
关键词：
error rate; curve fitting; maximum likelihood; minimum squared error;
D O I：
10.1109/redundancy48165.2019.9003350
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
The problem of fitting experimental or simulated error rate data with analytical curves is analyzed. The comparison is made between the maximum likelihood (ML) fitting and widely used minimization of squared error in log domain (Log-MSQ). It is shown that ML fitting demonstrates lower sensitivity to a particular sample realization of error events, and also allows to take into account different reliability of different BER measurements that is often the practical situation. Computer simulations confirmed superiority of ML fitting over Log-MSQ for various error rate measurement scenarios.
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页码：181 / 185
页数：5
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