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Electron beam induced current studies on a photoconductor made of partially compensated GaAs (vol 153, pg 299, 1996)
被引:0
|
作者
:
Riesz, F
论文数:
0
引用数:
0
h-index:
0
Riesz, F
Toth, AL
论文数:
0
引用数:
0
h-index:
0
Toth, AL
机构
:
来源
:
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
|
1996年
/ 154卷
/ 02期
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:
T [工业技术];
学科分类号
:
08 ;
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页码:K8 / K8
页数:1
相关论文
共 6 条
[1]
Electron beam induced current studies on a photoconductor made of partially compensated GaAs
Riesz, F
论文数:
0
引用数:
0
h-index:
0
机构:
Hungarian Acad of Sciences, Budapest
Riesz, F
Toth, AL
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引用数:
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机构:
Hungarian Acad of Sciences, Budapest
Toth, AL
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH,
1996,
153
(01):
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-
304
[2]
Cathodoluminescence and electron beam induced current study of partially relaxed AlGaAs/GaAs/InGaAs heterojunction phototransistors under operating conditions
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JOURNAL OF APPLIED PHYSICS,
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[3]
COMPARATIVE STUDIES OF DEFECTS IN GAAS ON SILICON SUBSTRATES USING ELECTRON-BEAM-INDUCED CURRENT AND TRANSMISSION ELECTRON-MICROSCOPY
HUMPHREYS, TP
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