Mueller matrix elements that characterize scattering from coated random rough surfaces

被引:11
|
作者
Zhang, YZ [1 ]
Bahar, E [1 ]
机构
[1] Univ Nebraska, Dept Elect Engn, Ctr Electroopt, Lincoln, NE 68588 USA
关键词
electromagnetic scattering; nonhomogeneous media;
D O I
10.1109/8.774161
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The Mueller matrix completely characterizes scattered electromagnetic waves. It relates the incident to the scattered Stokes vectors, The Mueller matrix, which contains intensity and relative phase data, is very useful for remote sensing. The Mueller matrix characterizing scattering from coated two dimensional (2-D) random rough surfaces is obtained from full-wave ion paper. The general bistatic scattering case is considered in solutions for the scattered fields considered in the companion paper. The general bistatic scattering case is considered in the analysis. However, for the numerical simluations presented here, the backscatter case is considered in particular, since backscatter is usually measured in remote sensing. The uniformly homogeneous and isotropic, with a Gaussian surface-height joint coated 2-D random rough surfaces are assumed here to be probability-density function. The diffuse incoherent and coherent contributions to the Mueller matrix elements are evaluated. The computer simulations of realistic models of relavent physical problems related to remote sensing of irregular stratified media can be used to determine the optimum modes of detection anile, and the specific Mueller matrix elements most sensitive to changes in medium parameters.
引用
收藏
页码:949 / 955
页数:7
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