X-ray microdiffraction study of the half-V-shaped switching liquid crystal

被引：1
|
作者：
Takada, K
Noma, T
Togano, T
Mukaide, T
Iida, A
机构：
[1] Canon Inc, Kanagawa 2430193, Japan
[2] High Energy Accelerator Res Org, Inst Mat Struct Sci, Photon Factory, Tsukuba, Ibaraki 3050801, Japan
来源：
POWDER DIFFRACTION | 2004年 / 19卷 / 01期
关键词：
D O I：
10.1154/1.1649330
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Local layer structures and their formation process in a half-V-shaped switching ferroelectric liquid crystal (HV-FLC) were investigated by means of synchrotron X-ray microdiffraction. The HV-FLC is a FLC that has a cholesteric-chiral smectic C (Ch-SmC*) phase transition sequences. X-ray microdiffraction measurements revealed that the SmC* phase in the HV-FLC was composed of asymmetric chevron and inclined-bookshelf structures. In addition, temperature-controlled X-ray diffraction measurements showed that the transient layer structures appeared during the Ch to SmC* phase transition. (C) 2004 International Centre for Diffraction Data.
引用
收藏
页码：53 / 55
页数：3
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