Comprehensive Online Defect Diagnosis in On-Chip Networks

被引：0

作者：

Ghofrani, Amirali ^{[1
]}

Parikh, Ritesh ^{[2
]}

Shamshiri, Saeed ^{[1
]}

DeOrio, Andrew ^{[2
]}

Cheng, Kwang-Ting ^{[1
]}

Bertacco, Valeria ^{[2
]}

机构：

[1] Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA

[2] Univ Michigan, Dept Elect Engn & Comp Sci, Ann Arbor, MI 48109 USA

来源：

2012 IEEE 30TH VLSI TEST SYMPOSIUM (VTS) | 2012年

基金：

美国国家科学基金会;

关键词：

Network-on-Chip; permanent faults; online diagnosis; error correcting codes; fault-tolerant router;

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

We propose a comprehensive yet low-cost solution for online detection and diagnosis of permanent faults in on-chip networks. Using error syndrome collection and packet/flit-counting techniques, high-resolution defect diagnosis is feasible in both datapath and control logic of the on-chip network without injecting any test traffic or incurring significant performance overhead.

引用

页码：44 / 49

页数：6

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