A Linearized Growth Curve Model for Software Reliability Data Analysis

被引：1
|
作者：
Kimura, Mitsuhiro [1 ]
机构：
[1] Hosei Univ, Dept Ind & Syst Engn, Tokyo, Japan
来源：
RECENT ADVANCES IN RELIABILITY AND QUALITY IN DESIGN | 2008年
关键词：
D O I：
10.1007/978-1-84800-113-8_13
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：275 / 290
页数：16
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