Non-Destructive Testing for Cracks in Special Conductive Materials

被引：0
|
作者：
Dedkova, Jarmila [1 ]
机构：
[1] FEEC BUT, Brno, Czech Republic
来源：
INTELLIGENT COMPUTER TECHNIQUES IN APPLIED ELECTROMAGNETICS | 2008年 / 119卷
关键词：
D O I：
暂无
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
In this paper we propose new approaches for recovering conductivity distribution of special structures called honeycombs using electric impedance tomography (EIT). There is presented that algorithms based on stochastic methods are suitable for the detection of some cracks in the conductive honeycombs. There are compared numerical results obtained using stochastic method and using widely known deterministic methods.
引用
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页码：299 / 303
页数：5
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