Direct measurement of lateral macrostep velocity on an AIN vicinal surface by transmission electron microscopy

被引:8
|
作者
Shen, X. Q. [1 ]
Matsuhata, H. [1 ]
Ide, T. [1 ]
Shimizu, M. [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Adv Power Elect Res Ctr, Tsukuba, Ibaraki 3058568, Japan
关键词
MOLECULAR-BEAM EPITAXY; GAN FILMS; GROWTH; REDUCTION; DISLOCATIONS; PROPAGATION; OVERGROWTH; SUBLIMATION; MECHANISMS; DENSITIES;
D O I
10.1063/1.4721656
中图分类号
O59 [应用物理学];
学科分类号
摘要
Lateral macrostep motion on a vicinal AIN surface is experimentally characterized by the threading dislocation behaviors in an AIN film via transmission electron microscopy (TEM). TEM observations of the macrostep-induced dislocation bending and kink formation offer a new way to directly measure the lateral velocity of macrostep motion. The lateral macrostep velocity is found to be inversely proportional to the macrostep height, which agrees with the crystal growth theory. The surface diffusion length of an Al adatom on the vicinal AIN surface is approximately 6.8 nm, as estimated from the relationship between the lateral velocity and the height of the macrosteps. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4721656]
引用
收藏
页数:4
相关论文
共 50 条
  • [1] Direct measurement of electron channeling in a crystal using scanning transmission electron microscopy
    Kourkoutis, L. Fitting
    Parker, M. K.
    Vaithyanathan, V.
    Schlom, D. G.
    Muller, D. A.
    [J]. PHYSICAL REVIEW B, 2011, 84 (07)
  • [2] Direct measurements of surface stress using transmission electron microscopy
    Twesten, RD
    Gibson, JM
    Hellman, OC
    [J]. SURFACE REVIEW AND LETTERS, 1997, 4 (02) : 245 - 269
  • [3] DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON-MICROSCOPY
    CHERNS, D
    [J]. PHILOSOPHICAL MAGAZINE, 1974, 30 (03): : 549 - 556
  • [4] MEASUREMENT OF LATERAL ELECTRON VELOCITY IN A STATIONARY BEAM
    GINKIN, VP
    MESHKOV, IN
    SKRINSKI.AN
    FAINSHTE.VG
    [J]. PRIBORY I TEKHNIKA EKSPERIMENTA, 1972, (06): : 26 - 28
  • [5] Studies of surface stress by reflection electron microscopy and transmission electron microscopy
    Tamura, H
    Nishii, K
    Minoda, H
    Tanishiro, Y
    Yagi, K
    [J]. SURFACE SCIENCE, 1996, 357 (1-3) : 576 - 580
  • [6] Simultaneous measurement of lateral and vertical size of nanoparticles using transmission scanning electron microscopy (TSEM)
    Buhr, E.
    Bug, M. U.
    Bergmann, D.
    Cizmar, P.
    Frase, C. G.
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2017, 28 (03)
  • [7] Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device
    Mueller, Knut
    Ryll, Henning
    Ordavo, Ivan
    Ihle, Sebastian
    Strueder, Lothar
    Volz, Kerstin
    Zweck, Josef
    Soltau, Heike
    Rosenauer, Andreas
    [J]. APPLIED PHYSICS LETTERS, 2012, 101 (21)
  • [8] Surface transmission electron microscopy on structures with truncation
    Takayanagi, K
    Naitoh, Y
    Oshima, Y
    Mitome, M
    [J]. SURFACE REVIEW AND LETTERS, 1997, 4 (04) : 687 - 694
  • [9] Transmission electron microscopy of surface and interfacial steps
    Gibson, JM
    Chen, X
    Pohland, O
    [J]. SURFACE REVIEW AND LETTERS, 1997, 4 (03) : 559 - 566
  • [10] Applications of direct detection device in transmission electron microscopy
    Jin, Liang
    Milazzo, Anna-Clare
    Kleinfelder, Stuart
    Li, Shengdong
    Leblanc, Philippe
    Duttweiler, Fred
    Bouwer, James C.
    Peltier, Steven T.
    Ellisman, Mark H.
    Xuong, Nguyen-Huu
    [J]. JOURNAL OF STRUCTURAL BIOLOGY, 2008, 161 (03) : 352 - 358