Local electrical properties of thermally grown oxide films formed on duplex stainless steel surfaces

被引：8

作者：

Guo, L. Q. ^{[1
]}

Yang, B. J. ^{[1
]}

He, J. Y. ^{[2
]}

Qiao, L. J. ^{[1
]}

机构：

[1] Univ Sci & Technol Beijing, Key Lab Environm Fracture MOE, Corros & Protect Ctr, Beijing 100083, Peoples R China

[2] Norwegian Univ Sci & Technol, Dept Struct Engn, N-7491 Trondheim, Norway

来源：

APPLIED SURFACE SCIENCE | 2018年 / 444卷

基金：

中国国家自然科学基金;

关键词：

Duplex stainless steel; Oxide film; Current sensing atomic force microscopy; AES; XPS; Semiconductor; STRESS-CORROSION CRACKING; PASSIVE FILM; AISI; 304-STAINLESS-STEEL; ELECTRONIC-STRUCTURE; PHOTOELECTROCHEMICAL ANALYSIS; SEMICONDUCTING PROPERTIES; BUFFER SOLUTION; XPS; AES; SUSCEPTIBILITY;

D O I：

10.1016/j.apsusc.2018.03.047

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The local electrical properties of thermally grown oxide films formed on ferrite and austenite surfaces of duplex stainless steel at different temperatures were investigated by Current sensing atomic force microscopy, X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES). The current maps and XPS/AES analyses show that the oxide films covering austenite and ferrite surfaces formed at different temperatures exhibit different local electrical characteristics, thickness and composition. The dependence of electrical conductivity of oxide films covering austenite and ferrite surface on the formation temperature is attributed to the film thickness and semiconducting structures, which is intrinsically related to thermodynamics and kinetics process of film grown at different temperature. This is well elucidated by corresponding semiconductor band structures of oxide films formed on austenite and ferrite phases at different temperature. (C) 2018 Elsevier B.V. All rights reserved.

引用

页码：48 / 55

页数：8

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