Performance of a focal plane detector for soft X-ray imaging spectroscopy based on back-illuminated sCMOS

被引:6
|
作者
Chen, Can [1 ,2 ]
Wang, Yusa [1 ]
Xu, Yupeng [1 ,2 ]
Zhao, Zijian [1 ]
Qiu, Hongyun [3 ]
Hou, Dongjie [1 ]
Yang, Xiongtao [1 ]
Ma, Jia [1 ]
Chen, Yong [1 ]
Zhao, Yang [3 ]
Liu, Hua [3 ]
Zhao, Xiaofan [1 ]
Zhu, Yuxuan [1 ,4 ]
机构
[1] Chinese Acad Sci, Inst High Energy Phys, Key Lab Particle Astrophys, Beijing 100049, Peoples R China
[2] Univ Chinese Acad Sci, Chinese Acad Sci, Beijing 100049, Peoples R China
[3] QHYCCD Ltd, Beijing 100084, Peoples R China
[4] Jilin Univ, Coll Phys, Changchun 130012, Peoples R China
关键词
Back-illuminated CMOS sensor; X-ray detector; X-ray optics; Alignment; Imaging spectroscopy; eXTP;
D O I
10.1016/j.nima.2022.166465
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Spectroscopy focusing array (SFA) and polarimetry focusing array (PFA) are the two major payloads of the enhanced X-ray Timing and Polarimetry mission (eXTP). Nested Wolter-I X-ray mirror module is implemented in SFA and PFA to achieve a high effective area. When evaluating the properties of the mirror module, the alignment of the optical axis of the X-ray mirror module and a quasi-parallel X-ray beam is a prerequisite for ensuring accuracy of the results. To assist the alignment of the X-ray mirror module, an X-ray focal plane detector with one of the largest detection areas, is designed based on a back-illuminated scientific complementary metal-oxide-semiconductor transistor (sCMOS) sensor(GSENSE6060BSI; Gpixel Inc). Then the characteristics of readout noise, dark current, and split-pixel event properties of the detector are studied with the self-developed multi-target fluorescence X-ray source in a 100-m long X-ray test facility. The energy calibration is performed based on the single-pixel event, and the energy non-linearity of the detector is also observed. Finally, based on the optical model, the eXTP mirror module is simulated, and the alignment test of the Wolter-I X-ray mirror module designed for Einstein Probe/Follow-up X-ray Telescope via the ''Burkert test'' method is demonstrated.
引用
收藏
页数:8
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