Finite element modeling of thermal fatigue and damage of solder joints in a ceramic ball grid array package

被引:24
|
作者
Hong, BZ
机构
[1] IBM Microelectronics Division, Hopewell Junction
关键词
ceramic ball grid array (CBGA); finite element; ratcheting; solder joint; thermal fatigue; viscoplastic;
D O I
10.1007/s11664-997-0256-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A nonlinear finite element model is presented for analyzing the cyclic and thermal fatigue loading and for viscoplastic damage characterization of the lead-tin (Pb-Sn) solder joints in a ceramic ball grid array (CBGA) surface mount, package. An approach using a Delta is an element of(eq)(in)-modified Coffin-Manson equation is proposed to estimate the fatigue life of the solder joints, The Delta is an element of(in)(eq) represents a saturated equivalent inelastic strain range as determined by the finite element model, The present study shows that the predictied fatigue life and the associated damage mechanism of the solder joint agree reasonably well with the test data for the 18, 25, and 32 mm CBGA packages run at a cyclic temperature load of 0 degrees C/100 degrees C with a frequency of 1.5 cycles per hour. Analysis also shows that a preferred failure site is expected to occur in and around the Pb37-Sn63 solder attachment of tile solder joint A time-dependent (creep induced) damage mechanism is found to be more pronounced than the time-independent (plastic deformation) mechanism.
引用
收藏
页码:814 / 820
页数:7
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