Qualifications strategies in IC manufacturing

被引:1
|
作者
Delarozée, G [1 ]
Favaron, J [1 ]
机构
[1] SERMA Technol, F-33608 Pessac, France
关键词
D O I
10.1016/S0167-9317(99)00425-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper treats of qualification strategies from a user point of view. Improvements in quality and reliability performances implies to use new methods and methodologies, since several years old approaches such as receiving inspection and extensive reliability test performing have shown their limitations. New qualification methods have to be coherent with the 'build in reliability' concept. Among these new tools, statistical process control and line survey are discussed and presented.
引用
收藏
页码:11 / 16
页数:6
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