A Study of Path Delay Variations in the Presence of Uncorrelated Power and Ground Supply Noise

被引：0

作者：

Todri, A. ^{[1
]}

Bosio, A. ^{[1
]}

Dilillo, L. ^{[1
]}

Girard, P. ^{[1
]}

Pravossoudovitch, S. ^{[1
]}

Virazel, A. ^{[1
]}

机构：

[1] Univ Montpellier 2, CNRS, LIRMM, Montpellier, France

来源：

2011 IEEE 14TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS (DDECS) | 2011年

关键词：

path delay; IR drop; ground bounce; resonance frequency;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

As technology scales down, the effects of power supply noise and ground bounce are becoming significantly important. In the existing literature, it has been shown that excessive power supply noise can affect the path delay, while ground bounce is either neglected or assumed similar to power supply noise. In this work, we present a detailed study of combined and uncorrelated power supply noise and ground bounce and their impact on the path delay. Our analyses show that different combination of power supply noise and ground bounce can lead to either delay speed-up or slow-down. Furthermore, our study shows the degrading influence of supply noise resonance on the path delay. We perform HSPICE simulations for path delay analysis on various technology nodes i.e. 130nm, 90nm, 65nm and 45nm

引用

页码：189 / 194

页数：6

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