Lock-in detection for pulsed electrically detected magnetic resonance

被引：25

作者：

Hoehne, Felix ^{[1
]}

Dreher, Lukas ^{[1
]}

Behrends, Jan ^{[2
]}

Fehr, Matthias ^{[2
]}

Huebl, Hans ^{[3
]}

Lips, Klaus ^{[2
]}

Schnegg, Alexander ^{[2
]}

Suckert, Max ^{[1
]}

Stutzmann, Martin ^{[1
]}

Brandt, Martin S. ^{[1
]}

机构：

[1] Tech Univ Munich, Walter Schottky Inst, D-85748 Garching, Germany

[2] Helmholtz Zentrum Berlin Mat & Energie, Inst Silizium Photovoltaik, D-12489 Berlin, Germany

[3] Bayer Akad Wissensch, Walther Meissner Inst, D-85748 Garching, Germany

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2012年 / 83卷 / 04期

关键词：

ELECTRON-SPIN-RESONANCE; MICROCRYSTALLINE SILICON;

D O I：

10.1063/1.4704837

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We show that in pulsed electrically detected magnetic resonance (pEDMR) signal modulation in combination with a lock-in detection scheme can reduce the low-frequency noise level by one order of magnitude and in addition removes the microwave-induced non-resonant background. This is exemplarily demonstrated for spin-echo measurements in phosphorus-doped silicon. The modulation of the signal is achieved by cycling the phase of the projection pulse used in pEDMR for the readout of the spin state. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4704837]

引用

页数：4

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