Infrared frequency selective surfaces fabricated using optical lithography and phase-shift masks

被引:29
|
作者
Spector, SJ
Astolfi, DK
Doran, SP
Lyszczarz, TM
Raynolds, JE
机构
[1] MIT, Lincoln Lab, Lexington, MA 02420 USA
[2] Lockheed Martin, Schenectady, NY 12301 USA
来源
关键词
D O I
10.1116/1.1420198
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A frequency selective surface (FSS) structure has been fabricated for use in a thermophotovoltaic system. The FSS provides a means for reflecting the unusable light below the band gap of the thermophotovoltaic cell while transmitting the usable light above the band gap. This behavior is relatively independent of the light's incident angle. The fabrication of the FSS was done using optical lithography and a phase-shift mask. The FSS cell consisted of circular slits spaced by 1100 nm. The diameter and width of the circular slits were 870 and 120 nm, respectively. The FSS was predicted to pass wavelengths near 7 Am and reflect wavelengths outside of this pass band. The FSSs fabricated performed as expected with a pass band centered near 5 mum. (C) 2001 American Vacuum Society.
引用
收藏
页码:2757 / 2760
页数:4
相关论文
共 50 条
  • [31] Design of hybrid attenuated phase-shift masks with indium-tin-oxide absorbers for extreme ultraviolet lithography
    Kang, Hee Young
    Kim, Mi Kyoung
    Hwangbo, Chang Kwon
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2008, 53 (03) : 1638 - 1641
  • [32] FABRICATION OF CONTROLLED SLOPE ATTENUATED PHASE-SHIFT X-RAY MASKS FOR 250 NM SYNCHROTRON LITHOGRAPHY
    GENTILI, M
    DIFABRIZIO, E
    GRELLA, L
    BACIOCCHI, M
    MASTROGIACOMO, L
    MAGGIORA, R
    XIAO, J
    CERRINA, F
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (06): : 3954 - 3958
  • [33] Accurate phase measurement in phase-shift masks with a differential heterodyne interferometer
    Fujita, Hiroshi
    Miyashita, Hiroyuki
    Nakamura, Hiroyuki
    Sano, Hisatake
    Conference Record - IEEE Instrumentation and Measurement Technology Conference, 1994, 2 : 683 - 688
  • [34] Frequency Offset Estimation using a Kalman Filter in Coherent Optical Phase-Shift Keying Systems
    Zhang, Shaoliang
    Kam, Pooi Yuen
    Yu, Changyuan
    Chen, Jian
    2010 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) AND QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (QELS), 2010,
  • [35] COMBINED FREQUENCY AND PHASE-SHIFT KEYING
    OMAHONY, MJ
    ELECTRONICS LETTERS, 1976, 12 (21) : 550 - 551
  • [36] Reducing the effects of aberrations with phase-shift masks and optimized resists
    Schenker, Richard
    Microlithography World, 2000, 9 (02):
  • [37] Selective dry etching of attenuated phase-shift mask materials for extreme ultraviolet lithography using inductively coupled plasmas
    Jung, H. Y.
    Park, Y. R.
    Lee, H. J.
    Lee, N. -E.
    Jeong, C. Y.
    Ahn, Jinho
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2009, 27 (06): : 2361 - 2365
  • [38] Quartz etch challenges for 45 nm phase-shift masks
    Anderson, Scott A.
    Chandrachood, Madhavi
    Grimbergen, Michael
    Leung, Toi Yue Becky
    Ibrahim, Ibrahim
    Panayil, Sheeba
    Kumar, Ajay
    PHOTOMASK AND NEXT GENERATION LITHOGRAPHY MASK TECHNOLOGY XIII, PTS 1 AND 2, 2006, 6283
  • [39] Fabrication of mid-infrared frequency-selective surfaces by soft lithography
    Paul, KE
    Zhu, C
    Love, JC
    Whitesides, GM
    APPLIED OPTICS, 2001, 40 (25) : 4557 - 4561
  • [40] FIB REPAIR OF DEFECTS IN RIM AND ATTENUATED PHASE-SHIFT MASKS
    CUI, Z
    PREWETT, PD
    WATSON, J
    MARTIN, B
    MICROELECTRONIC ENGINEERING, 1995, 27 (1-4) : 331 - 334