Counting statistics of single electron transport in a quantum dot

被引：451
|
作者：
Gustavsson, S [1 ]
Leturcq, R
Simovic, B
Schleser, R
Ihn, T
Studerus, P
Ensslin, K
Driscoll, DC
Gossard, AC
机构：
[1] ETH, Solid State Phys Lab, CH-8093 Zurich, Switzerland
[2] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA
来源：
PHYSICAL REVIEW LETTERS | 2006年 / 96卷 / 07期
关键词：
D O I：
10.1103/PhysRevLett.96.076605
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We have measured the full counting statistics of current fluctuations in a semiconductor quantum dot (QD) by real-time detection of single electron tunneling with a quantum point contact. This method gives direct access to the distribution function of current fluctuations. Suppression of the second moment (related to the shot noise) and the third moment (related to the asymmetry of the distribution) in a tunable semiconductor QD is demonstrated experimentally. With this method we demonstrate the ability to measure very low current and noise levels.
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页数：4
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