Growth, structural, and magnetic characterization of epitaxial Co2MnSi films deposited on MgO and Cr seed layers

被引：16

作者：

Ortiz, G. ^{[1
,2
]}

Garcia-Garcia, A. ^{[1
,3
,4
]}

Biziere, N. ^{[1
]}

Boust, F. ^{[2
]}

Bobo, J. F. ^{[1
,2
]}

Snoeck, E. ^{[1
]}

机构：

[1] CNRS, Ctr Elaborat Mat & Etud Struct, F-31055 Toulouse, France

[2] CNRS, Off Natl Etud & Rech Aerosp, F-31055 Toulouse, France

[3] Univ Zaragoza, CSIC, Inst Ciencia Mat Aragon, E-50009 Zaragoza, Spain

[4] Univ Porto, Fac Ciencias, IFIMUP, IN, P-4169007 Oporto, Portugal

来源：

JOURNAL OF APPLIED PHYSICS | 2013年 / 113卷 / 04期

关键词：

MOLECULAR-BEAM EPITAXY; FE FILMS; UNIAXIAL ANISOTROPY;

D O I：

10.1063/1.4789801

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report detailed structural characterization and magneto-optical Kerr magnetometry measurements at room temperature in epitaxial Co2MnSi thin films grown on MgO(001) and Cr(001) buffered MgO single crystals prepared by sputtering. While Co2MnSi/Cr//MgO(001) films display the expected cubic anisotropy, the magnetization curves obtained for Co2MnSi//MgO(001) samples exhibit a superimposed in-plane uniaxial magnetic anisotropy. The evolution of magnetization with film thickness points to a relevant interfacial Co2MnSi-buffer layer (Cr or MgO) contribution which competes with magnetic properties of bulk Co2MnSi, resulting in a drastic change in the magnetism of the whole sample. The origin of this interfacial magnetic anisotropy is discussed and correlated with our structural studies. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4789801]

引用

页数：7

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