Exchange bias: Interface imperfections and temperature dependence

被引：9

作者：

Kim, JV ^{[1
]}

Wee, L ^{[1
]}

Stamps, RL ^{[1
]}

Street, R ^{[1
]}

机构：

[1] Univ Western Australia, Dept Phys, Nedlands, WA 6907, Australia

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1999年 / 35卷 / 05期

基金：

澳大利亚研究理事会; 美国国家科学基金会;

关键词：

antiferromagnet; exchange bias; imperfections; multilayer;

D O I：

10.1109/20.801063

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Calculations are presented showing how exchange bias in antiferromagnet/ferromagnet bilayers can be modified by interface roughness, Effects of steps and line defects are explored for compensated and uncompensated antiferromagnetic interfaces. The angular dependence of the bias field on orientation and interface structure is calculated, and thermal effects related to stability are discussed.

引用

下载

页码：2994 / 2997

页数：4

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