Electromechanical Coupling in AlGaN/AlN/GaN HEMT's

被引:0
|
作者
Padmanabhan, B. [1 ]
Vasileska, D. [1 ]
Goodnick, S. M. [1 ]
机构
[1] Arizona State Univ, Tempe, AZ 85287 USA
关键词
GaN HEMTs; Piezoelectric Polarization Charge Density;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report on a theoretical model which provides the gate voltage dependence of the piezoelectric polarization charge in GaN HEMT devices. The model utilizes a generalization of Gauss' law, imposing constraints on the electric displacement vector D. The constraint on D is given by the continuity of the perpendicular component of the displacement vector across an interface. Poisson's equation is then solved across various layers under proper boundary conditions for the applied bias. The piezoelectric polarization charge is reduced due to the electromechanical coupling compared to the uncoupled case. Under high sheet electron densities, the correction in the piezoelectric polarization charge is also lower due to smaller electric fields.
引用
收藏
页码:679 / 681
页数:3
相关论文
共 50 条
  • [1] Current degradation due to electromechanical coupling in GaN HEMT's
    Padmanabhan, Balaji
    Vasileska, Dragica
    Goodnick, Stephen M.
    [J]. MICROELECTRONICS JOURNAL, 2013, 44 (07) : 592 - 597
  • [2] Study of Millimeter Wave AlGaN/AlN/GaN HEMT
    Cheng, Zhiqun
    Liu, Tang
    Jin, Liwei
    Feng, Zhihong
    Song, Jianbo
    Yin, Jiayun
    [J]. 2011 INTERNATIONAL CONFERENCE ON ELECTRONICS, COMMUNICATIONS AND CONTROL (ICECC), 2011, : 2306 - 2308
  • [3] Current degradation due to electromechanical coupling in GaN HEMT's
    Padmanabhan, Balaji
    Vasileska, Dragica
    Goodnick, Stephen M.
    [J]. NANOTECHNOLOGY 2012, VOL 2: ELECTRONICS, DEVICES, FABRICATION, MEMS, FLUIDICS AND COMPUTATIONAL, 2012, : 17 - 20
  • [4] Analyzing the AlGaN/AlN/GaN Heterostructures for HEMT Applications
    Durukan, I. Kars
    Akpinar, O.
    Avar, C.
    Gultekin, A.
    Ozturk, M. K.
    Ozcelik, S.
    Ozbay, E.
    [J]. JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, 2018, 13 (03) : 331 - 334
  • [5] Reliability of GaN HEMTs: Current Degradation in GaN/AlGaN/AlN/GaN HEMT
    Padmanabhan, Balaji
    Vasileska, Dragica
    Goodnick, Stephen M.
    [J]. 2012 15TH INTERNATIONAL WORKSHOP ON COMPUTATIONAL ELECTRONICS (IWCE), 2012,
  • [6] AlGaN/AlN/GaN high-power microwave HEMT
    Shen, L
    Heikman, S
    Moran, B
    Coffie, R
    Zhang, NQ
    Buttari, D
    Smorchkova, IP
    Keller, S
    DenBaars, SP
    Mishra, UK
    [J]. IEEE ELECTRON DEVICE LETTERS, 2001, 22 (10) : 457 - 459
  • [7] Characterization of AlGaN and GaN Based HEMT With AlN Interfacial Spacer
    Roy, Pallavi
    Jawanpuria, Surbhi
    Vismita
    Prasad, Santashraya
    Islam, Aminul
    [J]. 2015 FIFTH INTERNATIONAL CONFERENCE ON COMMUNICATION SYSTEMS AND NETWORK TECHNOLOGIES (CSNT2015), 2015, : 786 - 788
  • [8] AlGaN/AlN/GaN大功率微波HEMT
    一凡
    [J]. 微电子技术, 2003, (05) : 8 - 8
  • [9] Effects of nonlinear elasticity and electromechanical coupling on optical properties of InGaN/GaN and AlGaN/AlN quantum wells
    Lepkowski, S. P.
    Majewski, J. A.
    [J]. ACTA PHYSICA POLONICA A, 2006, 110 (02) : 237 - 242
  • [10] TCAD Investigation of AlGaN/AlN/GaN HEMT for Hydrogen Sensing Applications
    Kumaran, Renuka
    Rahul, J.
    Varghese, Arathy
    Rajan, Lintu
    [J]. 8TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM 2024, 2024, : 325 - 327