The current image of single SnO2 nanobelt nanodevice studied by conductive atomic force microscopy

被引：12
|
作者：
Wang, Shujie [1 ]
Cheng, Gang [1 ]
Cheng, Ke [1 ]
Jiang, Xiaohong [1 ]
Du, Zuliang [1 ]
机构：
[1] Henan Univ, Key Lab Special Funct Mat, Kaifeng 475004, Peoples R China
来源：
NANOSCALE RESEARCH LETTERS | 2011年 / 6卷
基金：
中国国家自然科学基金;
关键词：
SnO2; nanobelt; C-AFM; current image; CARBON NANOTUBES; OXIDE; NANORIBBONS; ZNO;
D O I：
10.1186/1556-276X-6-541
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
A single SnO2 nanobelt was assembled on a pair of Au electrodes by electric-field assembly method. The electronic transport property of single SnO2 nanobelt was studied by conductive atomic force microscopy (C-AFM). Back-to-back Schottky barrier-type junctions were created between AFM tip/SnO2 nanobelt/Au electrode which can be concluded from the I-V curve. The current images of single SnO2 nanobelt nanodevices were also studied by C-AFM techniques, which showed stripes patterns on the nanobelt surface. The current images of the nanobelt devices correlate the microscopy with separate transport properties measurement together.
引用
收藏
页码：1 / 6
页数：6
相关论文
共 50 条
  • [1] The current image of single SnO2 nanobelt nanodevice studied by conductive atomic force microscopy
    Shujie Wang
    Gang Cheng
    Ke Cheng
    Xiaohong Jiang
    Zuliang Du
    [J]. Nanoscale Research Letters, 6
  • [2] The current image of a single CuO nanowire studied by conductive atomic force microscopy
    Cheng, Gang
    Wang, Shujie
    Cheng, Ke
    Jiang, Xiaohong
    Wang, Lixiang
    Li, Linsong
    Du, Zuliang
    Zou, Guangtian
    [J]. APPLIED PHYSICS LETTERS, 2008, 92 (22)
  • [3] Characterization of the Oxygen Ionosorption Effect on a Single SnO2 Nanowire by Using Conductive Atomic Force Microscopy
    Heo, Jinhee
    Lee, Junghwan
    [J]. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2012, 12 (06) : 4864 - 4867
  • [4] Quantitative measurement of local conductivity of SnO2 nanobelt field effect transistor utilizing microwave atomic force microscopy
    Zhao, Minji
    Kimura, Yasuhiro
    Toku, Yuhki
    Ju, Yang
    [J]. APPLIED PHYSICS EXPRESS, 2023, 16 (01)
  • [5] Surface roughness in sputtered SnO2 films studied by atomic force microscopy and spectroscopic light scattering
    Lindström, T
    Isidorsson, J
    Niklasson, GA
    [J]. JOURNAL OF APPLIED PHYSICS, 2000, 87 (09) : 4562 - 4571
  • [6] Optically modulated electromechanical coupling properties of single GaN nanobelt based on conductive atomic force microscopy
    Deng Chang-Fa
    Yan Shao-An
    Wang Dong
    Peng Jin-Feng
    Zheng Xue-Jun
    [J]. ACTA PHYSICA SINICA, 2019, 68 (23)
  • [7] The conductive properties of single DNA molecules studied by torsion tunneling atomic force microscopy
    Wang, W.
    Niu, D. X.
    Jiang, C. R.
    Yang, X. J.
    [J]. NANOTECHNOLOGY, 2014, 25 (02)
  • [8] Electrical conductivities of nanosheets studied by conductive atomic force microscopy
    Yilmaz, Neval
    Ida, Shintaro
    Matsumoto, Yasumichi
    [J]. MATERIALS CHEMISTRY AND PHYSICS, 2009, 116 (01) : 62 - 66
  • [9] Electromechanical Characterization of Single GaN Nanobelt Probed with Conductive Atomic Force Microscope
    X. Y. Yan
    J. F. Peng
    S. A. Yan
    X. J. Zheng
    [J]. Journal of Electronic Materials, 2018, 47 : 3869 - 3875
  • [10] Electromechanical Characterization of Single GaN Nanobelt Probed with Conductive Atomic Force Microscope
    Yan, X. Y.
    Peng, J. F.
    Yan, S. A.
    Zheng, X. J.
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2018, 47 (07) : 3869 - 3875
12345