Near-field optical investigations of photonic crystal microresonators

被引：0

作者：

Buchler, BC

Kramper, P

Kafesaki, M

Soukoulis, CM

Sandoghdar, V ^{[1
]}

机构：

[1] ETH, Chem Phys Lab, CH-8093 Zurich, Switzerland

[2] Univ Konstanz, Fachbereich Phys, D-78457 Constance, Germany

[3] Res Ctr Crete, Iraklion, Crete, Greece

[4] Iowa State Univ, Ames Lab, Ames, IA 50011 USA

[5] Iowa State Univ, Dept Phys & Astron, Ames, IA 50011 USA

来源：

IEICE TRANSACTIONS ON ELECTRONICS | 2004年 / E87C卷 / 03期

关键词：

photonic crystal; scanning near-field optical microscopy; SNOM; point defect; microresonator;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present an overview of our work on the application of scanning near-field optical microscopy (SNOM) to photonic crystal structures. Our results show that SNOM can be used to map the subwavelength confinement of light to a point-defect in a 2D photonic crystal microresonator. Comparison with numerical modelling shows that SNOM is able to resolve patterns in the intensity distribution that are due to the slight non-uniformity in the crystal structure. We also discuss the future possibilities for applications of different modes of SNOM to photonic crystal devices.

引用

页码：371 / 377

页数：7

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