Near-field optical investigations of photonic crystal microresonators

被引:0
|
作者
Buchler, BC
Kramper, P
Kafesaki, M
Soukoulis, CM
Sandoghdar, V [1 ]
机构
[1] ETH, Chem Phys Lab, CH-8093 Zurich, Switzerland
[2] Univ Konstanz, Fachbereich Phys, D-78457 Constance, Germany
[3] Res Ctr Crete, Iraklion, Crete, Greece
[4] Iowa State Univ, Ames Lab, Ames, IA 50011 USA
[5] Iowa State Univ, Dept Phys & Astron, Ames, IA 50011 USA
来源
IEICE TRANSACTIONS ON ELECTRONICS | 2004年 / E87C卷 / 03期
关键词
photonic crystal; scanning near-field optical microscopy; SNOM; point defect; microresonator;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present an overview of our work on the application of scanning near-field optical microscopy (SNOM) to photonic crystal structures. Our results show that SNOM can be used to map the subwavelength confinement of light to a point-defect in a 2D photonic crystal microresonator. Comparison with numerical modelling shows that SNOM is able to resolve patterns in the intensity distribution that are due to the slight non-uniformity in the crystal structure. We also discuss the future possibilities for applications of different modes of SNOM to photonic crystal devices.
引用
收藏
页码:371 / 377
页数:7
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