Measurement systems for the investigation of soldering quality in high-power diode laser bars

被引：3

作者：

Troger, J ^{[1
]}

Schwarz, M ^{[1
]}

Jakubowicz, A ^{[1
]}

机构：

[1] Bookham Switzerland AG, CH-8045 Zurich, Switzerland

来源：

JOURNAL OF LIGHTWAVE TECHNOLOGY | 2005年 / 23卷 / 11期

关键词：

gratings; imaging; photothermal effects; semiconductor laser arrays; soldering;

D O I：

10.1109/JLT.2005.857757

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Thermal and spatial-spectral imaging methods are used to investigate the soldering quality in high-power laser-bar devices. The temperature distribution and the wavelength profile across a driven laser bar correlate with the local thermal resistance between laser and cooler and, thus, with the uniformity of the solder layers. Measurements with a properly soldered and a deficiently soldered laser bar are made for the illustration and comparison of the methods.

引用

页码：3889 / 3892

页数：4

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