Measurement systems for the investigation of soldering quality in high-power diode laser bars

被引：3
|
作者：
Troger, J [1 ]
Schwarz, M [1 ]
Jakubowicz, A [1 ]
机构：
[1] Bookham Switzerland AG, CH-8045 Zurich, Switzerland
来源：
JOURNAL OF LIGHTWAVE TECHNOLOGY | 2005年 / 23卷 / 11期
关键词：
gratings; imaging; photothermal effects; semiconductor laser arrays; soldering;
D O I：
10.1109/JLT.2005.857757
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Thermal and spatial-spectral imaging methods are used to investigate the soldering quality in high-power laser-bar devices. The temperature distribution and the wavelength profile across a driven laser bar correlate with the local thermal resistance between laser and cooler and, thus, with the uniformity of the solder layers. Measurements with a properly soldered and a deficiently soldered laser bar are made for the illustration and comparison of the methods.
引用
收藏
页码：3889 / 3892
页数：4
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